books by Yusuf Leblebici

books by Yusuf Leblebici

books:

Yusuf Leblebici

Fundamentals of High-Frequency CMOS Analog Integrated Circuits
Duran Leblebici, Yusuf Leblebici

Cambridge University Press, 2009

With a design-centric approach, this textbook bridges the gap between fundamental analog electronic circuit textbooks and more advanced RF IC design texts. The major issues that must be taken into account when combining analog and digital circuit building blocks are covered, together with the key criteria and parameters that are used to describe ...

CMOS Multichannel Single-Chip Receivers for Multi-Gigabit Optical Data Communications (Analog Circuits and ...
Paul Muller, Yusuf Leblebici

Springer, 2007

While the throughput of microprocessor systems tends to increase as a result of ongoing technology scaling and the advent of multi-core systems, the off-chip I/O communication bandwidth emerges as one of the potential bottlenecks that limit overall performance. In order to alleviate the communication speed constraints, optical data communication ...

Microelectronics Education: Proceedings of the 5th European Workshop on Microelectronics Education, held in ...

Springer, 2004

In this book key contributions on developments and challenges in research and education on microelectronics, microsystems and related areas are published. Topics of interest include, but are not limited to: emerging fields in design and technology, new concepts in teaching, multimedia in microelectronics, industrial roadmaps and microelectronic ...

CMOS Digital Integrated Circuits Analysis & Design

Sung-Mo (Steve) Kang, Yusuf Leblebici

McGraw-Hill Science/Engineering/Math, 2002

Great Book !
No other book gives a more effective treatment of the subject. A thorough explanation of the basics followed by a stepwise approach towards advanced topics. Thanks Kang and Leblebici for coming up with such a great book.

Hot-Carrier Reliability of MOS VLSI Circuits (The Springer International Series in Engineering and Computer ...
Yusuf Leblebici, Sung-Mo (Steve) Kang

Springer, 1993

This volume addresses the issues related to hot-carrier reliability of MOS VLSI circuits, ranging from device physics to circuit design guidelines. It presents a unified view of the physical mechanisms involved in hot-carrier induced device degradation, the prevalent models for these mechanisms, and simulation methods for estimating hot-carrier ...